XRD PANalytical Empyrean
DESCRIPTION
TECHNIQUES
- Thin film analysis, XRD phase analysis, rocking curve
- Crystal surface perfection
- Powder X-ray diffraction, rapid scan typically 2 to 5 minutes
- Offline analysis of data
- Crystallographic orientation
SPECIFICATIONS
- Thin film analysis. The crystallographic texture and composition can be determined using XRD Phase Analysis
- Rocking curve measurements allow the surface perfection to be determined
- Powder XRD done at standard angular resolutions is extremely rapid and easy to perform.
Very high angular resolution scans are possible to help solve difficult problems
- Crystallographic orientation of samples up to 20 x 20 x 20 mms can be determined
LOCATION
Materials Testing Lab
CONTACT INFO
Dr. Thomas Delclos,
Muffle Furnace
DESCRIPTION
The unit consists of:
1) a heating chamber;
2) a basic automatic control without over temperature protection
OR an automatic proportioning-digital set, digital read control with over temperature protection;
3) a door interlock relay for user safety. Programmable furnace is designed to control a programmed temperature profile.
The profile is in the format of ramps and dwell segments.
The first ramp, RAMP 1, starts at the initial measured furnace temperature.
This ramp is positive going at a programmed rate until the programmed level is reached.
The set point will stay at this level for a period.
When the second ramp reaches the second programmed level, the set point stays at that level for the duration of the segment.
The Type 6000 Automatic furnace is designed as a single set point automatic temperature controlled furnace
able to reach and maintain one temperature value.
LOCATION
Materials Testing Lab - 1A Undercroft
CONTACT INFO
Dr. Thomas Delclos,
Bruker D2 Phaser XRD
DESCRIPTION
The D2 PHASER is a portable desktop XRD instrument for research and quality control.
It is for instance possible to investigate crystal structures applying the fundamental parameters approach in the TOPAS software, nano-structures for fast and reliable SAXS measurements, or micro-structures (crystallite size)
LOCATION
KU campus room F120
CONTACT INFO
Dr. Thomas Delclos
VStar Sorption Analyser
DESCRIPTION
The Vstar vapor sorption analyzer goes beyond water sorption to provide vapor sorption analysis using a wide variety of organic vapors at a wide range of temperatures.
Meticulous control of the manifold temperature from the vapor source to the sample eliminates the possibility of
local condensation of the adsorptive and ensures the most accurate analysis possible.
LOCATION
Masdar Campus 1A Undercroft MT lab
CONTACT INFO
Dr. Thomas Delclos,
ICDD and CDS - Workstation (CCL)
DESCRIPTION
Workstation to analyze your diffraction data.
Last ICDD database uploaded
LOCATION
Arzanah 8025
CONTACT INFO
Praveen Mangutti