DESCRIPTION
TECHNIQUES
- Thin film analysis, XRD phase analysis, rocking curve
- Crystal surface perfection
- Powder X-ray diffraction, rapid scan typically 2 to 5 minutes
- Offline analysis of data
- Crystallographic orientation
SPECIFICATIONS
- Thin film analysis. The crystallographic texture and composition can be determined using XRD Phase Analysis
- Rocking curve measurements allow the surface perfection to be determined
- Powder XRD done at standard angular resolutions is extremely rapid and easy to perform.
Very high angular resolution scans are possible to help solve difficult problems
- Crystallographic orientation of samples up to 20 x 20 x 20 mms can be determined
LOCATION
Materials Testing Lab
CONTACT INFO
Dr. Thomas Delclos,