LakeShore 7607 Hall Measurement System
DESCRIPTION
The LakeShore's Hall Effect Measurement System (HMS, model 7607) is an advanced electrical measurement system designed to characterize a wide range of materials and analyze their electronic transport properties. This Hall measurement system is useful to study Hall effects and transport properties in pure semiconducting or doped materials, magnetoresistance materials, superconductors, conducting oxides and polymers by making four-point electrical measurements or six-point Hall bar measurements. This equipment allows users to control the magnetic field while measuring, and determine material properties, such as resistivity, carrier concentration, carrier mobility, Hall coefficient, etc. Both thin films and bulk samples can be measured.
LOCATION
Optoelectronics Characterization Lab-SAN- Arzanah-8-020
CONTACT INFO
Teenu Thomas (
Ecopia HMS-5000 Hall Effect Measurement System
DESCRIPTION
The HMS-5000 Hall Effect Measurement System plots concentration versus temperature, mobility versus temperature, resistivity versus temperature, conductivity versus temperature, and Hall coefficient
versus temperature. The systems provides the test results as tabular data as well as in graph form. The system automatically applies and switches the input current, measures the voltages, changes temperature, and moves the magnets all without user intervention. The system ramps to each user defined temperature, stabilizes, makes the measurement, and then plots the various temperature dependent material electrical properties.
LOCATION
Optoelectronics Characterization Lab-SAN- Arzanah-8-020
CONTACT INFO
Teenu Thomas(
LAMBDA 1050 UV/Vis/NIR Spectrometer
DESCRIPTION
The LAMBDA 1050 is a high-performance UV/Vis/NIR spectrometer. Designed to achieve a greater level of sensitivity, resolution and speed in the NIR range, it simplifies the analysis of difficult samples such as high absorbing glass, optical coatings or thin film filters. It features two large sampling compartments and a variety of snap-in modules and accessories, including a general purpose optical bench, integrating spheres and Universal Reflectance Accessory.
LOCATION
Optoelectronics Characterization Lab-SAN- Arzanah-8-020
CONTACT INFO
Teenu Thomas (
WCT-120 Wafer Lifetime & Suns-Voc Curve Tracer Tools
DESCRIPTION
The WCT-120 is a tabletop silicon lifetime and wafer metrology system, suitable for both device research and industrial process control. It can be used for monitoring multicrystalline wafers, dopant diffusions, and low-lifetime samples. This method complements the use of the transient photoconductance technique that is also standard on this instrument. It also yields the implied open-circuit voltage (versus illumination) curve, which is comparable to an I-V curve at each stage of a solar cell process.
The Suns-Voc stage is used for measuring wafers after Al firing, and then again after front-grid firing. This allows the optimization and monitoring of these steps to maintain voltage, obtain good ohmic contacts, and avoid shunting. By either probing the p+ and n+ regions directly or probing the metallization layer (if present), the Illumination-Voc curve can be measured. This curve can be displayed as a Suns-Voc plot or in the form of a standard photovoltaic curve which can be used to characterize shunting. The entire curve is measured at open circuit, so it is free from the effects of series resistance.
LOCATION
Optoelectronics Characterization Lab-SAN- Arzanah-8-020
CONTACT INFO
Teenu Thomas (
Agilent B1505A Curve Tracer + Signatone 1160 Manual Prober
DESCRIPTION
The Agilent B1505A Power Device Analyzer / Curve Tracer has the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V), medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz to 5 MHz).
The Signatone S-1160 Probe Station is fitted with high powered optics for probing small geometries and low powered optics for probing bonding pads and larger geometries.
LOCATION
Optoelectronics Characterization Lab-SAN- Arzanah-8-020
CONTACT INFO
Teenu Thomas (