DESCRIPTION

LOCATION

Optoelectronics Characterization Lab-SAN- Arzanah-8-020

CONTACT INFO

Teenu Thomas (This email address is being protected from spambots. You need JavaScript enabled to view it.)

DESCRIPTION

The Delcom Instruments Benchtop Noncontact Sheet Resistance Meter uses Eddy Current to measure sheet resistance. The measurement system can measure sheet conductance, sheet resistance, thickness (with known resistivity), and resistivity (with known thickness). It is nondestructive, can read through insulating layers, and gives nearly instantaneous readings. The minimum sample size is 1 cm diameter circle.
Two separate sensors are available with the following ranges:
*From 5 to 100,000 ohms/square
*From .005 to 100 ohms/square.
No more than 3% deviation from the true sheet resistance value of tested material.

LOCATION

Optoelectronics Characterization Lab-SAN- Arzanah-8-020

CONTACT INFO

Teenu Thomas (This email address is being protected from spambots. You need JavaScript enabled to view it.)

DESCRIPTION

LOCATION

Device Characterization Lab - UndercroftOptoelectronics Characterization Lab-SAN- Arzanah-8-027A

CONTACT INFO

Nafeez Taher (This email address is being protected from spambots. You need JavaScript enabled to view it.)

DESCRIPTION

The Sol3A 94123A is a Class AAA Solar Simulator with a 1600 Watt Xenon source lamp and 12 in. x 12 in. illuminated area with Air Mass 1.5G filter to produce standard 1 Sun illumination. It is certified to IEC / JIS / ASTM standards for Spectral Match, Non-Uniformity of Irradiance, and Temporal Instability of Irradiance.

The Oriel PVIV Test Station is set up to run accurate I-V measurements and calculates critical parameters such as short circuit current (Isc), current density (Jsc), open circuit voltage (Voc), fill factor (ff), maximum output power (Pmax), cell efficiency (η), and other standard photovoltaic cell parameters. Included is a Keithley 2400 source-meter that can measure currents up to 1 Amp. The station also includes IV measurement software on a computer system, reference cell, electrical probes, sample positioning chuck with vacuum pump, and chiller unit for temperature control.

LOCATION

Optoelectronics Characterization Lab-SAN- Arzanah-8-020

CONTACT INFO

Teenu Thomas (This email address is being protected from spambots. You need JavaScript enabled to view it.)