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  • Core Labs

Helios NanoLab

DESCRIPTION

The Helios NanoLab 650 features FEI™s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI™s 11th DualBeam platform, it is designed to access a new world of extreme high resolution (XHR) 2D and 3D characterization, 3D NanoPrototyping, and higher quality sample preparation.
The outstanding imaging capabilities of the Helios NanoLab begin with its Elstar FESEM. Thanks to its integrated monochromator (UC) and beam deceleration, it delivers sub-nanometer resolution across the whole 1-30 kV range. The Elstar features other unique technologies such as constant power lenses for higher thermal stability and electrostatic scanning for higher deflection linearity and speed. Its through-the-lens detector, set for highest collection efficiency of SE (secondary electrons) and on-axis BSE (backscattered electrons), is complemented by FEI™s latest advanced detection suite including three novel detectors: two multi-segment solid state detectors for stunning low kV SE/BSE and S/TEM (scanning transmission electron mode) performance, and a third dedicated to optimized FIB-SE and -SI (secondary ion) imaging.

 

LOCATION

Microscopy Suite - Masdar, Building 1A, undercroft

 

CONTACT INFO

Dr. Cyril Aubry <This email address is being protected from spambots. You need JavaScript enabled to view it.> Mr. Mohamed Ibrahim Elsayed Ali Hussein Helal <This email address is being protected from spambots. You need JavaScript enabled to view it.>

Nova Nano SEM

DESCRIPTION

The FEI Nova NanoSEM 650 is a high-quality nanoscale research tool for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation.
More samples, including the most non-conducting or contaminating materials, can equally be characterized or analyzed in the Nova NanoSEM 50 series, using its unique low vacuum capabilities. Characterization in low vacuum extends all the way up to ultra-high resolution, thanks to FEI€™s Helix detector technology. Small and large samples can easily be accommodated inside the large chamber, on the Nova NanoSEM™s high precision, high stability stages.

 

LOCATION

Microscopy Suite - Masdar Institute, Building 1A, undercroft

 

CONTACT INFO

Dr. Cyril Aubry This email address is being protected from spambots. You need JavaScript enabled to view it. , Mr. Mohamed Ibrahim Elsayed Ali Hussein Helal This email address is being protected from spambots. You need JavaScript enabled to view it.

Quanta 250 FEG - ESEM

DESCRIPTION

The Quanta series has an easy-to-use and flexible user interface with functions to maximize productivity and allow high quality data to be collected. Designed by microscopists for microscopists, this instrument series is truly above and beyond easy to use.
Navigation features include auto navigation montage, double-click stage-movements, drag-to-zoom and other useful features incorporated as standard. SmartSCAN technology is smart scanning strategy to reduce noise and provide better data.
Additional new options such as beam deceleration to improve low kV performance,Nav-Cam color image navigation, and new retractable detectors provide even greater flexibility to the Quanta series

 

LOCATION

Microscopy Suite - Masdar Institute, building 1A, undercroft

 

CONTACT INFO

Dr. Cyril Aubry <This email address is being protected from spambots. You need JavaScript enabled to view it.> Mr. Mohamed Ibrahim Elsayed Ali Hussein Helal <This email address is being protected from spambots. You need JavaScript enabled to view it.>

Quanta 3D FEG - SEM/FIB

DESCRIPTION

This is a dual beam scanning electron microscope (SEM) that is also equipped with a focused ion beam (FIB). This SEM functions permit microscopic observations of a specimen while the FIB functions allows cutting of your sample. This FEG-SEM-FIB has an Omniprobe for TEM sample preparation. An SDD EDS analyzes specimen elemental chemistry. In addition an electron backscattered diffraction system (EBSD) collects the crystallography information from the specimen. Using these capabilities together makes it possible to learn about, or modify, a specimen's three dimensional (3D) structure and chemistry. It also has plug in STEM and backscatter detectors as well as environmental SEM capability!

 

LOCATION

Microscopy Suite - Masdar Institute, building 1A, undercroft

 

CONTACT INFO

Dr. Cyril Aubry This email address is being protected from spambots. You need JavaScript enabled to view it. , Mr. Mohamed Ibrahim Elsayed Ali Hussein Helal This email address is being protected from spambots. You need JavaScript enabled to view it.

Tecnai TEM 200kV

DESCRIPTION

The FEI Tecnai transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries. With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.

 

LOCATION

Microscopy Suite - Masdar Institute, building 1A, undercroft

 

CONTACT INFO

Dr. Cyril Aubry This email address is being protected from spambots. You need JavaScript enabled to view it. , Mr. Mohamed Ibrahim Elsayed Ali Hussein Helal This email address is being protected from spambots. You need JavaScript enabled to view it.

  1. Titan TEM 300kV
  2. SEM JEOL JSM-7610F

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Contact Us

Email: kurl@ku.ac.ae

Phone: +971 (0)2 312 4328

Office: Room 8-101, Arzanah Building,
Sas-Al-Nakhl Campus

Postal: P.O. Box 127788, Khalifa University,
Abu Dhabi, United Arab Emirates